EBSD.com is an educational site by Oxford Instruments

EBSD is used widely in industrial scientific research in applications concerned with:

  • Texture measurement in sheet materials in the steel and aluminium industry for quality control applications.
  • Study of texture in sheet steel and aluminium for improved formability and surface finish.
  • Study of texture in relation to electrical and magnetic properties.
  • Influence of grain boundary properties on corrosion, fracture and fatigue in metal manufacturing and nuclear power industries.
  • Retained ferrite and austenite measurement for steel property enhancement.
  • Through thickness texture measurements of sputter targets for quality control applications.
  • Analysis and orientation measurement of second phase particles for materials property enhancement and component lifetime prediction.
  • Baseline measurement of grain sizes in microelectronic interconnects.
  • Development of thin film devices.
  • As a complementary technique to qualify and improve traditional techniques such as optical microscopy and X-ray diffraction.
  • Microscopic studies of texture (preferred orientation measurements) and the relation of microtexture to microstructure.
  • As a complementary technique to X-ray diffraction for the study of texture on a macroscopic scale.
  • Studying recrystallisation in metals and alloys.
  • Study of microstructure, in particular the capability of crystal orientation maps to reveal unambiguously the presence, location and size of grains.
  • Measurement of grain boundary misorientations and the relation of grain boundary types to phenomena such as segregation, corrosion, precipitation, fatigue and fracture resistance.
  • Distribution of grain boundary misorientations, twin boundaries and other special boundaries including their effect of material properties.
  • Texture development, electromigration and reliability in copper and aluminium microelectronic interconnects.
  • Study of fabric in geological materials.
  • Thin films, in particular growth of epitaxial layers with applications in solar cells, thin film transistors, non volatile memories, ferroelectric films, and light emitting and laser diodes.
  • Influence of grain boundary properties on fracture.
  • High temperature superconductors, including the influence of texture and grain boundary type on superconducting properties.
  • Measurement and distribution of strain in deformed materials
  • Orientation of secondary phases and precipitates.
  • Phase identification, discrimination and fraction determination including analysis of intermetallic materials, carbides and hydrides.
  • Retained ferrite/austenite measurement in particular at microscopic levels.
  • Through thickness variations in texture, for example in sputtering targets.
  • Combination with focussed ion beams for three dimensional analysis of materials.

And much ...much more...

Go To Top