EBSD.com is an educational site by Oxford Instruments

EBSD and EDS are integrated in the Oxford Instruments AZtec Synergy system providing sophisticated solutions to materials characterisation. This is includes innovative methods to correctly characterise materials with similar crystal structures. 

The EDS spectra and EBSPs can be acquired simultaneously for phase identification. In addition, simultaneous map data can be acquired to determine phase distribution and phase fraction.

To see a demonstration of simultaneous EBSD & EDS acquisition in AZtec Synergy, click here.

The following are application notes for AZtec Synergy.

Transmission Kikuchi diffraction (TKD) is a new approach to SEM-based diffraction applies conventional EBSD hardware to an electron-transparent sample It has been proven to enable spatial resolutions better than 10 nm. This technique is ideal for routine EBSD characterisation of both nanostructured and highly deformed samples.

The following are application notes for AZtec TKD.

3D EBSD provides a deeper understanding of microstructure by offering a complete description of grains, inclusions etc. This solution includes advanced 3D characterisation of grain boundaries, morphological & crystallographic relationships between grains and phases and analysis of microtextures.

The following are application notes for 3D Application notes.

Microstructure imaging using Forescatter diodes (FSD) on the EBSD detector highlights regions of interest during an EBSD analysis. Traditionally, these images were presented in greyscale, by adding colour and mixing images a lot more sample detail can be seen

The following are application notes for AZtec FSD imaging.

Go To Top