EBSD.com is an educational site by Oxford Instruments

EBSD is used widely in industrial scientific research in applications concerned with:

  • Texture measurement in sheet materials in the steel and aluminium industry for quality control applications.
  • Study of texture in sheet steel and aluminium for improved formability and surface finish.
  • Study of texture in relation to electrical and magnetic properties.
  • Influence of grain boundary properties on corrosion, fracture and fatigue in metal manufacturing and nuclear power industries.
  • Retained ferrite and austenite measurement for steel property enhancement.
  • Through thickness texture measurements of sputter targets for quality control applications.
  • Analysis and orientation measurement of second phase particles for materials property enhancement and component lifetime prediction.
  • Baseline measurement of grain sizes in microelectronic interconnects.
  • Development of thin film devices.
  • As a complementary technique to qualify and improve traditional techniques such as optical microscopy and X-ray diffraction.
  • Microscopic studies of texture (preferred orientation measurements) and the relation of microtexture to microstructure.
  • As a complementary technique to X-ray diffraction for the study of texture on a macroscopic scale.
  • Studying recrystallisation in metals and alloys.
  • Study of microstructure, in particular the capability of crystal orientation maps to reveal unambiguously the presence, location and size of grains.
  • Measurement of grain boundary misorientations and the relation of grain boundary types to phenomena such as segregation, corrosion, precipitation, fatigue and fracture resistance.
  • Distribution of grain boundary misorientations, twin boundaries and other special boundaries including their effect of material properties.
  • Texture development, electromigration and reliability in copper and aluminium microelectronic interconnects.
  • Study of fabric in geological materials.
  • Thin films, in particular growth of epitaxial layers with applications in solar cells, thin film transistors, non volatile memories, ferroelectric films, and light emitting and laser diodes.
  • Influence of grain boundary properties on fracture.
  • High temperature superconductors, including the influence of texture and grain boundary type on superconducting properties.
  • Measurement and distribution of strain in deformed materials
  • Orientation of secondary phases and precipitates.
  • Phase identification, discrimination and fraction determination including analysis of intermetallic materials, carbides and hydrides.
  • Retained ferrite/austenite measurement in particular at microscopic levels.
  • Through thickness variations in texture, for example in sputtering targets.
  • Combination with focussed ion beams for three dimensional analysis of materials.

And much ...much more...

These papers and application notes are freely downloadable - no registration required. Some may be a few years old and from HKL Technologies, the company we acquired some time ago, but the technology is still appropriate to today.

Do you have a paper you would like to share with other users of this site? Please use the 'Feedback and Contribute' button below.

When two or more phases with similar crystal structure but different chemistry are present in a material then a combination of EDS and EBSD are required to discriminate such phases.

Integrated EDS/EBSD in AZtec software provides a convenient solution to this problem, where EDS spectra and EBSPs can be acquired simultaneously to quantify the elements present, search databases for candidate phases to match composition and crystal structure.

These data/phases can then be used to map the area of interest for both chemistry and crystal orientation, to provide a distribution of the different phases by chemistry and crystal structure. Phases with similar crystal structure but different chemistry can be discriminated off-line.

You can see a demo of simultaneous EDS/EBSD here.

The following are application notes for simultaneous EBSD/EDS.

These papers and application notes are freely downloadable - no registration required. Some may be a few years old and from HKL Technologies, the company we acquired some time ago, but the technology is still appropriate to today.

Do you have a paper you would like to share with other users of this site? Please use the 'Feedback and Contribute' button below.

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